RESEARCH FACILITIES

NORTH CAROLINA AGRICULTURE & TECHNICAL STATE UNIVERSITY

COLLEGE OF ENGINEERING

SELECTED RESEARCH FACILITIES

Selected Research Facilities of the Center for Advanced Materials and Smart Structures in the Department of Mechanical Engineering at NC A&T SU

• MTS 880 Model Computer Controlled Servohydraulic Testing Machine
  ORNL Self Aligning Grip
  Zygo Model 121 Laser Extensometer ATS Fumace Capable of 1600⁰C
  Water Cooled Pull-rod Grips for both Flat and Button Head Samples

• MTS 110 Kip Frame with Instron 8500 Computer Control System
  Hydraulic Grip for Different Samples
  Various Advanced Software for Mechanical Testing

  

• High Temperature 4-Point Bend Test Equipment with 1650° C furnace capacity for brittle material testing

  

• ISl Scanning Electron Microscopy
• Tracor Northern TN5400 EDS Thin Window Chemical Analysis Set-up
• Nikon Epiphot Inverted Microscope and Other Optical Microscopes Metallurgical
• Polaroid MP-4 Camera System
• Various Accessories for Dark Room Photography
• Polaron SEM Coating Systems
• Grinder/Polisher
• Ultrasonic Cleaner
• Tripod Polisher
• Various Lab Furnaces: Buehler, Ltd; Diamond Cutter with Isomet Lowspeed Saw, Isomet Dressing Chuck and Isomet Watering Blades
• Minimet with Precision Thinning Attachment
• LECO VC50 Diamond Saw Cutter
• Microstructure Analysis System-Real time, High-resolution Image Capture and Analysis.

  

This laboratory contains an extensively instrumented single-cylinder research diesel engine that is currently being used to study the effects of ceramic coatings on internal combustion chamber surfaces on performance and emissions as part of the NSF-CAMSS center activities.

• Ricardo Hydra Research Engine
• Thermo-Environmental Mod 10AR Chemiluminescent NO/NOx Analyzer
• AVL Mod 415 Variable Sampling Smoke Meter
• Cambustion Mod HFR400 Fast Response FID Hydrocarbon Detector
• Luxtron Accufiber Mod 100 Fast Response Optical Fiber Infrared Temperature Monitor
• Two (2) Datametric Data 6000 Digital Wave Form Analyzers
• Nicolet 8 channel Odyssey High Speed Data Acquisition System
• DTK 66 Mhz/64 MB RAM PC with United Electronics WIN3O 8 Channel Data Acquisition Board

Manufacturing Laboratory has equipment for metal forming, machining, joining & RTM. Instrumentation and Controls Laboratory contains equipment for force / vibration measurement, surface characterization, and data acquisition and control of manufacturing processes.

• Vactronic AVS-6000 vacuum (10^-7 torr capable) bell jar system equipped with 2 kVA heater power supply and a residual gas analyzer
• Wyko RST 500 non-contact roughness & step tester with phase shifting / vertical scanning interferometry modes
• Unitron 4003 toolmaker’s microscope
• Lathe, mill, surface grinder instrumented with Kistler piezoelectric force I torque dynamometers and accelerometers
• SPC capable digital length measuring instruments with automated data logger
• Hydraulic press instrumented for force I displacement logging

• 2 Ling vibration shakers (900-Ib, 200-lb) and controllers
• 4 MB 50-lb vibration shakers and controllers
• 1 DP-420 FFT analyzer (8 channels)
• 2 digital oscilloscopes (4 channels)
• 1 dSPACE controller
• 1 HP data acquisition hardware and software
• 2 function generators
• 1 Kistler modal testing equipment
• certain amount of PZT patches and other sensors, actuators, and dynamic testing facilities

Selected Research Facilities of the Center for Advanced Materials and Smart Structures in the Department of Electrical Engineering at NC A&T SU

• Cryogenic Electrical and Optical Characterization System consists of:

Liquid Nitrogen Dewar (Infrared Laboratories ND5) with temperature controlled stage and Infrared Optical Windows
Temperature Controller Unit (Lakeshore 330)
Turbomechanical Pump (Varian)
Lock-in Amplifier (Stanford Research Systems 5R530)
Spectrum Analyzer (Stanford Research Systems SR 760)
Low-Pass Filter (Stanford Research Systems SR 640)
Digital Multimeter (Hewlett-Packard)
Digital Source Meter (Keithley 2400)
Impedance/Material Analyzer (Hewlett-Packard 429 lA)

• Ferroelectric Test System consists of:

Capacitance Meter (Radiant Technologies RT66A)
Probe Station (borrowed Rockwell Lab)

• High Power Lasers:

Fiber-coupled diode-pumped non-planar ring laser, Model 125
Diode-pumped solid-state nonplanar ring laser, Model 122.

• Optical Equipment:

Fabry-Perot Optical Spectrum Analyzer, New Focus, Model 1414
Traveling Wave Amplifier Model 1422
Spectrum Analyzer HP 8554
Spectrum Analyzer HP 493
Oscilloscope HP 1715A
Optical Power Meter
Fiber couplers
Fiber Optic Polarization Rotator
Laser-to-fiber coupler with optical output isolator
Continuously variable retarder

A. Growth Facilities

• EPI 930 nine source molecular beam epitaxial system with 500 amu RGA, 15 KeV RHEED gun, optical pyrometer with 600° C bakeable optical window for the view port, In, Ga sources, As valved cracker source, Sb cracker source. System is computer software controlled. Vacuum Barrier two phase separator is used for the liquid nitrogen transfer to the MBE cryopanel.
• Metalorganic vapor phase epitaxy system: atmospheric pressure system for III-V materials, three temperature-controlled liquid sources, 7.5-cm vertical fused silica reactor, RF induction-heated susceptor, hydrogen purifier, arsine and TBA source channels, eight-point hydride gas detection system in laboratory.
• 3 Liquid phase electroepitaxial systems; with hydrogen purifier and can be used as current controlled liquid phase epitaxial system
• A remote plasma deposition system for amorphous silicon and SiN thin films.

B. Characterization Facilities

• A Bede 200/D³ high resolution x-ray diffractometer system with a resolution of 12 arc seconds; computer software controlled A Philips x-ray diffractometer system with Cu-tube.
• Olympus BX60 and Nikon reflected light brightfieldldarkfield and Nomarski phase contrast microscope
• Rudolph Research AutoEL ellipsometer, He-Ne laser source.
• Leitz interference microscope for film thickness measurement.
• Photoluminescence system (0.5m spectrometer, argon ion and He-Ne laser excitation, PbS and S-20 detectors, lock in amplifier, light chopper, closed cycle low temperature (10K) sample chamber).
• Photoreflectance system (0.25m double grating monochromator, xenon arc lamp, tungsten lamp, and utilizes the low temperature closed cycle sample chamber).
• Hall effect/resistivity, van der Pauw method, 8kG electromagnet, low temperature (12K) closed-cycle refrigerator
• 2 low temperature closed cycle systems (one of them can go up to 10K and the HS-4, APD cryogenics can go as low as 3.6K).
• Tencor surface profiler (stylus).
• Computer-controlled current-voltage and capacitance-voltage measurement systems; two LCR meters, HP 4284A, 20 Hz to 1MHz

C. Deposition and Device Fabrication Facilities

• Electron beam evaporators (2), with cryopump vacuum systems, multiple-pocket hearths, single quartz crystal thickness/rate monitors.
• Ion beam sputtering system, Commonwealth Scientific.
• Optical photolithography, two contact photomask aligners, photoresist application and development systems.
• Annealing/alloying furnaces (2), fused silica tubes, inert gas or hydrogen ambient.

D. Miscellaneous Equipment

• 2 Millipore DI water systems.
• Various digital multimeters, electrometer, power supplies and recorders for materials and device characterization.
• 5 Exhaust fume hoods for chemical etching, cleaning, etc.
• RGA vacuum leak detector.

NORTH CAROLINA STATE UNIVERSITY

SELECTED RESEARCH FACILITIES

Laser and Optical Processing and Manufacturing Center, NCSU (J. Narayan, Director)

• Multigas Excimer Laser (Lumonics TE 290) - ArF, KrF, XeCI, Energy per pulse 1.5 J, l = 308 nm, Pulse width (FWHM) 35 ns, rep. rate 1 Hz. This laser delivers spatially uniform pulse.
• Lambda Physik (LPX 200 Excimer) - ArF, KrF, XeCI Energy per pulse 0.5 J, (l = 0.248 gin), Pulse width 20 ns, rep. rate 1-100 Hz. Pulse-to-pulse variation is very small < 5%.
• CO₂ Laser (Spectra Physics 810), CW mode: power (enhanced mode) 2 kW; Pulsed mode: Energy per pulse 1-2 J (X = 10.6gm), Pulse width 100 ms, rep. rate 0-5 kHz.
• Ar⁺ Ion CW Laser (Control Laser Corp. - Model 552A) l = 514 nm, Power 6-10 watts.
• Laser Processing Chambers (3) - ultra high vacuum (Laser MBE system), medium and low - the latter two can also be used for Laser CVD. Laser diagnostics QMS and OMA Systems.
• Kaufman ion source: energy 150-1000 eV and current 0.5 - 3.0 mA cm^-2.
• Plasma Spray Gun (50 kW).

• Ion Beam Thinning
• Optical Microscopy
• Computer Modelling
• SEM - 840 - II.

• 10K - close cycle refrigerator
• Computer controlled resistivity (T_c)
• Current density measurements.

• Annealing Furnaces
• Ball Mill
• Grinder
• Balance
• Presses.

• Raman Spectroscopy (Microprobe Capability)
• FTIR.

• Ultra-High Resolution TEM (200 KeV, Akashi - 002B) 0.18 nin resolution at Scherzer defocus, 0.13 nm at twice Scherzer defocus
• Analytical (200 KeV - Akashi - 002B) equipped with EDX detector with ultrathin window.

• Analytical and High Resolution Transmission Electron Microscope (Phillips EM-430). This instrument provides a unique capability for carrying out high-resolution atomic imaging, chemical analysis, microdiffraction, and electronic property [using electron-beam induced current (EBIC) and cathodoluminescence] measurements.
• Analytical Transmission Electron Microscopes (Hitachi HU-800).
• High Intensity, High Resolution X-ray Diffraction Facility (6 KW Rotating Anode).
• Research Scanning Electron Microscope (JEOL-840 and 6400).
• Dedicated Scanning Transmission High Resolution Electron Microscope with special Facilities for Auger Electron Spectroscopy.
• Rutherford Backscattering and Channeling System and Ion Implanters.
• Secondary Ion Mass Spectrometer (Ion microscope) (Cameca 6F SIMS).
• Electrical Characterization Facilities (Hall, I-V, C-V), DLTS, EBIC, etc. (Measurement Facilities).
• Evaporation and Deposition units including MBE and MOCVD system.
• Atomic absorption, Neutron Activators, and Thermomechanical analyses systems.
• IR and Raman Spectrometers and Ellipsometers.
• Rapid Thermal Annealing and Conventional Systems.
• Dedicated Scanning Auger Microscope.
• Scanning Tunneling and Atomic Force Microscopes.
• Fourier-transform infrared spectroscopy (FTIR) Facility.
• North Carolina Supercomputer Center Facilities
• Advanced Machine and Electronics Shops to support state-of-the-art Instrumentation